Comprehensive Raman study of epitaxial silicene-related phases on Ag(111)

• Dmytro Solonenko,
• Ovidiu D. Gordan,
• Guy Le Lay,
• Dietrich R. T. Zahn and
• Patrick Vogt

Beilstein J. Nanotechnol. 2017, 8, 1357–1365, doi:10.3762/bjnano.8.137

• epitaxially grown on Ag(111) were obtained using in situ Raman spectroscopy. Due to the obvious 2D nature of various epitaxial silicene structures, their fingerprints consist of similar sets of Raman modes. The reduced phase diagram also includes other Si phases, such as amorphous and crystalline silicon

• method, highly sensitive to the structural properties of the materials [21][22]. The first results on 2D Si structures, obtained using in situ Raman spectroscopy, conclusively confirmed the 2D nature of epitaxial (3×3)/(4×4) silicene and demonstrated an easy access to its chemical and physical properties

• presence of 2D Si layers on Ag(111). Conclusion We performed a comprehensive spectroscopic study of the silicene-related superstructures epitaxially grown on the Ag(111) surface by in situ Raman spectroscopy. The structural differences between the silicene-related phases, consistent with the scanning